模拟和混合信号集成电路的设计,测试和内置自测和自校准的有效和实用技术
Effective and Practical Techniques for Design, Testing, and Built-in Self-Test and Self-Calibration of Analog and Mixed-Signal Integrated Circuits
陈德刚   Degang Chen
报告人照片   陈德刚于1984获清华大学中国仪器仪表与自动化学士学位,1992年获得美国加州圣塔芭芭拉分校控制理论博士学位。1992,他是加州理工学院的John R. Pierce讲师。之后,他加入爱荷华州立大学,现任电气工程教授和Jerry Junkins大学工程系主任。他目前的研究兴趣是模拟和混合信号IC设计和测试,集成传感器设计,模拟验证,以及内置的自校准,以提高性能和可靠性。陈博士已经撰写和共同撰写了8项专利和280多篇主要期刊和顶级国际会议的评审出版物,其中,有15位获得了“最佳论文奖”和其他荣誉,包括享有盛誉的IEEE内德·科恩菲尔德最佳论文奖。
  In this talk, we will briefly review some recent analog design techniques for cost-effective enhancement of analog and mixed-signal circuit performance, for ultra-small and high linearity temperature sensors and current sensors, which are critical for power, thermal and reliability management. We will then focus on some effective and practical techniques for innovative testing, BIST, and BIST-based selfcalibration of analog to digital converters. In particular, we will describe several techniques to: 1) reduce test data acquisition time by >100X while maintaining or even improving test quality, 2) relax the test signal’s linearity requirement by hundreds to thousands of times without affecting test accuracy, 3) significantly reduce the clock jitter requirements, and/or 4) implement the relaxed test methods as BIST solutions for BIST-based calibration. Most of the results are validated at industry labs or productions tests at Texas Instruments, NXP, and Maxim
报告时间:2018年11月21日09时30分    报告地点:北区融合楼二楼微纳中心会议室
报名截止日期:2018年11月21日    可选人数:50